Rod L Electronics M150AC Hipot Tester – Industrial-Grade Used Unit

Description

Additional Features:

• Safe, Fast, Efficient
• Fully programmable test parameters
• Digital Display
• Resolution of programmable test parameters is 0.5%
• Performs an AC dielectric strength (Hipot) test concurrent with a ground continuity test
• Applies a test potential of up to 5000 VAC at 50 milliamps (user programmable)
• Performs tests in full compliance with UL, VOE, BSI, IEC, CSA, and other test standards

Specifications

• Output Test Voltage: 100 VAC-5K VAC*
• Output Voltage Ramp Time: 50 V/sec to 5kV/sec*
• Total Current Trip Point: 50 mA (maximum)*
• Real Current Trip Point: 5 mA (maximum)*
• Under Current Trip Point: 5 mA (maximum)*
• Test Time: 1 sec – 100 sec*
• *All of the above are User Programmable
• Shutdown Time: 2 milliseconds
• Arc Detection: Arc duration 1OµS or greater
• Ground Continuity: Low current (1.5 Amp @ 1.5V)
• Input Power Required: 115/230 VAC ± 10%, 47-63 Hz, 250 watts maximum, 30 watts typical
• Dimensions: 16.75″ x 7.00″ x 18.38″ (43cm x 18cm  x 47cm)

IEEE-488 BUS-compatible – enables data logging during each test, and remote programming of:

• Test Voltage
• Test Time
• Voltage Ramp Rate
• Real Current Trip Point
• Total Current Trip Point
• Under Current Trip Point

Detects and indicates the following events:

• Test Ready (Security Chassis Ground Sensed)
• Test in Progress
• Test Passed
• Test Failed:
• Arcing
• Excessive Total Leakage Current
• Excessive Resistive Leakage Current
• Under Current
• Lack of adequate Chassis Ground

Superior Safety Features

• Visual and Audible alert indicating Hipot test in progress
• Low Current Security Chassis Ground Circuit (ensures Device Under Test has ground connection of o.sn between chassis and power cord ground pin)
• Fast HV shutdown within 2 milliseconds of HV test automatically on test failure or on command

IEEE-488 BUS Programming

The Model M150AC Hipot Test System, when operated via the Model M1088C IEEE-488 BUS INTERFACE, functions as both a ” Talker “(T) and a “Listener” (L) in conjunction with the following signals:

• Output Voltage (T/L)
• Output Voltage Ramp Rate (L)
• Test Time (L)
• Total Current Trip Point (L)
• Total Current Magnitude (T)
• Real Current Trip Point (L)
• Real Current Magnitude (T)
• Under Current Trip Point (L)
• Test Status: Ready (T); In -Progress (T); Passed (T); Failed (T)
• Type of Failure (T)
• Start (L)
• Stop (L)
• Reset (L)

These signals can also be controlled using any controller capable of inputting and outputting digital and analog signals.

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