Description
Additional Features:
- Design Development and Compliance Testing of Optical and Electrical Signals to 2.5 Gb/s Rates
- Physical Layer Characterization of Communication Signals in Backplane, Midplane and Embedded Designs
- Optical and Electrical Signal Integrity, Margin Verification, Jitter and Timing Analysis
- Real-time Oscilloscope Platform with Up to 4 GHz True Analog Bandwidth and Down to 72 ps Rise Time (20% – 80%)
- >400,000 wfms/s Waveform Capture Rate, powered by exclusive DPX™ acquisition technology
- 20 GS/s Maxium Real-time Sample Rate
- Built-in Compliance Mask Tests with up to 2.5 Gb/s Optical and Electrical Data Stream Rates
- Integrated Optical Reference Receiver Protects Integrity of System Calibration
- Integrated Hardware Clock Recovery Provides Single-connection Convenience
- Up to 64 MB Record Length with MultiView Zoom™ for Quick Navigation of Long Records
- 64-Bit Serial Trigger for Isolation of Pattern-dependent Effects
- Complete Eye Pattern Measurements Suite Including Extinction Ratio, Q-factor, Eye Height/width, Jitter and Noise
- Waveform Database Acquisition Technology for Accurate Parametric Measurements on Eye Patterns
- TekConnect® Interface for High Fidelity Connection
- OpenChoice™ with Windows 2000 Delivers Built-in Networking and Analysis
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