Description
Features:
C Hi-Tester (1kHz and 1MHz) – Low Noise
- High-speed analog test time of 0.6 ms (at 1 MHz)
- Improved noise resistance and enhanced repeatability in measurement precision even for production lines
- 1 kHz and 1 MHz measurement frequency supports stable low capacitance testing with taping machines
- BIN function, for easy component screening
Hioki LCR Meters and Impedance Analyzers range from 1mHz to 3GHz devices to suit a wide range of applications in the testing of electronic components. 3506-10 is a dual-band capacitance meter designed to be integrated with automatic taping machines and sorters for the production of MLCC (multi-layer ceramic capacitors).
Faster Measurement and Improved Repeatability
Compared to the previous model (3506), 3506-10 delivers higher measurement speeds in FAST mode and improvement by a factor of approximately 7 in repeatability for measurement of minuscule capacitance values in high-noise environments. These characteristics make the instrument ideal for embedded measurement in taping machines, sorters, and other automatic systems.
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