Agilent 8502B Vector Network Analyzer – Used

Description

Additional Features:

• Frequency range: 500 kHz to 1.3 GHz
• Impedance: 75 ohms
• Directivity: >40 dB

Frequency response

Transmission

• Magnitude: ≤± -0.8 dB; Phase: ≤±8°

Reflection

• Magnitude: ≤ ±1.5 dB from 0.5 to 1300 MHz
• Phase: ≤+15° from 0.5 to 1300 MHz
• Phase (specified as deviation from linear phase): ≤ ±10° from 2 to 1300 MHz

Port Match

• Test Port Return Loss: ≥24 dB (≤ 1.135 SWR) from 2 to 1300 MHz; ≥18.0 dB (≤ 1.29 SWR) from 0.5 to 2 MHz

Test Port Open/Short Ratio

• Magnitude: ≤ ± 0.9 dB from 2 to 1300 MHz
• Phase: ≤±7.5° from 2 to 1300 MHz
• Magnitude: ≤±1.25 dB from 0.5 to 2 MHz
• Phase: ≤±10° from 0.5 to 2 MHz
• Incident Port Return Loss: ≥25 dB (≤ 1.12 SWR) from 2 TO 1000 MHz; ≥ 23 dB (≤ 1.15 SWR) from 0.5 to 1300 MHz
• Reflection Port Return Loss: ≥ 25 dB (≤ 1.12 SWR) from 2 to 1000 MHz; ≥23 dB (≤ 1.15 SWR) from 0.5 to 1300 MHz
• RF Input Port Return Loss: ≥ 23 dB (≤ 1.15 SWR)

General Specifications

• Maximum Operating Level: ≤+20 dBm
• Test Port: +26 dBm 30 Vdc Max
• RF Input Port: +30 dBm (1W) 7 Vdc Max
• Bias: 30 Vdc 500 mA Max
• Damage Level
• Bias Input: >30 Vdc, 500 mA
• RF Input: >+30 dBm (1W), 7 Vdc
• Test Port Return Loss: Typically 30 dB from 2 to 1300 MHz
• Insertion Loss with Attenuator Set to Zero
• Input to Test Port: 19 dB
• Input to Incident POrt: 31 dB
• Input to Reflection Port with Short on Test Port: 19 dB
• RF Attenuator Range: 0 to 70 dB in 10-dB steps
• DC Bias Input Range±30 Vdc, ± 200 mA; some degradation in RF specifications from 500 kHz to 100 MHz. 500 mA maximum
• RF Connectors: 75-ohm Type N Female on TEST port; 50-ohm Type N Female on REFLECTED, INCIDENT, and RF INPUT ports
• DC Bias Input Connector: 50-ohm BNC Female

The Agilent 8502B Transmission/Reflection Test Set contains the functions necessary to make simultaneous transmission and reflection measurements between 500 kHz and 1300 MHz. The test set consists of an RF power splitter to develop a reference or incident signal, a directional bridge to develop a reflected signal, and an attenuator to control the incident signal to the device under test.

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