Agilent 4142B Semiconductor Parameter Analyzer – Refurbished

Description

Additional Features:

• Flexible, modular architecture
• Wide measurement range with high resolution
• V: ±4 µV to ±1000 V, 0.05%
• l: ±20 fA to ±10 A, 0.2%
• Pulse measurement capabilities
• Pulse width 1 ms to 50 ms, 100 µs resolution
• High-speed measurement (typical)
• Sourcing or monitoring: 4 ms
• Vth, hFE extracting: 12 ms
• Internal memory
• Program memory: >2000 commands (typical)
• Data memory: 4004 measurement points

Offering a wide measurement range and excellent sensitivity, the Agilent 4142B modular DC source/monitor is a system-use DC measurement instrument especially designed for high-throughput DC semiconductor testers. A completely user-definable system component, the Agilent 4142B features modular architecture that allows you to build a custom configuration to suit your measurement needs. Eight plug-in module slots can accommodate any combination of modules. Choose from two types of source/monitor units (SMUs) to force or measure up to ±200 V and ±1 A: a high-current source/monitor unit (HCU) up to ±10 A, a high voltage source/monitor unit (HVU) up to ±1000 V, a voltage source/voltage monitor unit (VS/VMU), and an analog feedback unit (AFU). The instruments command and measurement datastorage capabilities, coupled with the high-speed HP-IB interface, minimize computer loading, enhance throughput, and simplify systemization.

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