Description
Features:
- Wide frequency coverage from 9 kHz to 4.5/6.5/9/14/20 GHz or 100 kHz to 26.5/32/44/53 GHz
- Fully capture device performance with a wide dynamic range of 140 dB
- Achieve complete device characterization with optional built in DC sources, bias tees, pulse generators and pulse modulators
- Consistently test between R&D and production with the same UI and SCPI commands as high-end PNAs
- Improve throughput by performing spectrum analysis, pulsed-RF measurements, vector mixer measurements, noise figure, and more on a single instrument
As devices become highly integrated, complete characterization requires a complete RF and microwave measurement solution. The E5080B provides R&D performance up to 53 GHz and advanced test flexibility. Best-in-class dynamic range, trace noise, and temperature stability guarantee reliability and repeatability.
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